2
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

M. Bushnell, Vishwani Agrawal
年:
2000
语言:
english
文件:
PDF, 37.00 MB
0 / 0
english, 2000
4
Neural Models and Algorithms for Digital Testing

Neural Models and Algorithms for Digital Testing

Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil (auth.)
年:
1991
语言:
english
文件:
PDF, 7.22 MB
0 / 0
english, 1991
5
Unified Methods for VLSI Simulation and Test Generation

Unified Methods for VLSI Simulation and Test Generation

Kwang-Ting (Tim) Cheng, Vishwani D. Agrawal
年:
1989
语言:
english
文件:
PDF, 6.39 MB
0 / 4.0
english, 1989
6
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

M. Bushnell, Vishwani Agrawal
年:
2000
语言:
english
文件:
PDF, 37.00 MB
0 / 0
english, 2000
8
Economics of Electronic Design, Manufacture and Test

Economics of Electronic Design, Manufacture and Test

Vishwani D. Agrawal (auth.), Magdy Abadir, Tony Ambler (eds.)
年:
1994
语言:
english
文件:
PDF, 4.46 MB
0 / 0
english, 1994
9
Concurrent and Comparative Discrete Event Simulation

Concurrent and Comparative Discrete Event Simulation

Ernst G. Ulrich, Vishwani D. Agrawal, Jack H. Arabian (auth.)
年:
1994
语言:
english
文件:
PDF, 5.72 MB
0 / 0
english, 1994