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X-Ray Spectroscopy: An Introduction

X-Ray Spectroscopy: An Introduction

Professor Bipin K. Agarwal Ph. D. (auth.)
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X-ray spectroscopy has emerged as a powerful tool in research and in industrial laboratories. It is used in the study of metals, semiconductors, amorphous solids, liquids and gases. This comprehensive presentation develops the subject from its basic principles and relates the theory to experimental observations. The new edition includes topics that have recently become important, for example, the X-ray laser, appearance potential spectroscopy, synchrotron radiation and EXAFS of high-Tc superconducting materials. A thorough introduction, up to research level, isprovided to EXAFS, which has seen rapid development in the past few years. This textbook conveniently presents the principles, applications and current techniques of X-ray spectroscopy, which makes it ideal for graduate students beginning research involving x-ray spectroscopy.
种类:
年:
1991
出版:
2
出版社:
Springer-Verlag Berlin Heidelberg
语言:
english
页:
421
ISBN 10:
3540507191
ISBN 13:
9783540507192
系列:
Springer Series in Optical Sciences 15
文件:
PDF, 9.37 MB
IPFS:
CID , CID Blake2b
english, 1991
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